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The International Workshop EMC Compo 2013 is focused on emission and susceptibility as well as power and signal integrity issues of digital, analogue and mixed signal integrated circuits, simulation, measurement, and modeling techniques
Book Synopsis 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) by : IEEE Staff
Download or read book 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) written by IEEE Staff and published by . This book was released on 2013-12-15 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The International Workshop EMC Compo 2013 is focused on emission and susceptibility as well as power and signal integrity issues of digital, analogue and mixed signal integrated circuits, simulation, measurement, and modeling techniques
The workshop will presents the state ofarts on IC electromagnetic compatibility related issues, not only fundamental improvements in modeling and measurement, but also novel design methodologies and standards
Book Synopsis 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) by : IEEE Staff
Download or read book 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) written by IEEE Staff and published by . This book was released on 2019-10-21 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The workshop will presents the state ofarts on IC electromagnetic compatibility related issues, not only fundamental improvements in modeling and measurement, but also novel design methodologies and standards
Book Synopsis The 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits by :
Download or read book The 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits written by and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
The achievements in terms of operating frequency and integration of semiconductor technology are constantly creating new challenges in EMC, which must necessarily be addressed at both the integrated circuit and system level Keeping up to date is of paramount importance to be successful in this field The 10th International Workshop EMC Compo 2015 is intended to be a place for exchange of the latest research achievements and experience in IC level EMC and it is addressed to researchers and Engineers from industry and from academia The workshop is focused on emission and susceptibility issues in digital, analogue and mixed signal integrated circuits The most recent advances in simulation and measurement techniques, models, standards, tools and design methodologies will be discussed A Technical Exhibition will also be held James Clerk Maxwell was born in Edinburgh and there will be an opportunity for delegates to visit his birthplace, in recognition of 150 years of his equations
Book Synopsis 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) by : IEEE Staff
Download or read book 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) written by IEEE Staff and published by . This book was released on 2015-11-10 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The achievements in terms of operating frequency and integration of semiconductor technology are constantly creating new challenges in EMC, which must necessarily be addressed at both the integrated circuit and system level Keeping up to date is of paramount importance to be successful in this field The 10th International Workshop EMC Compo 2015 is intended to be a place for exchange of the latest research achievements and experience in IC level EMC and it is addressed to researchers and Engineers from industry and from academia The workshop is focused on emission and susceptibility issues in digital, analogue and mixed signal integrated circuits The most recent advances in simulation and measurement techniques, models, standards, tools and design methodologies will be discussed A Technical Exhibition will also be held James Clerk Maxwell was born in Edinburgh and there will be an opportunity for delegates to visit his birthplace, in recognition of 150 years of his equations
The achievements in terms of operating frequency and integration of semiconductor technology are constantly creating new challenges in IC EMC, which must necessarily be addressed at both integrated circuits and system level Keeping up to date is of paramount importance to be successful in this field EMC Compo 2021 is intended to be a place for the exchange of the latest research achievements and experience in IC level EMC and it is addressed to researchers both from industry and from academia The most recent advances in simulation and measurement techniques, models, standards, tools, and design methodologies will be discussed A Technical Exhibition will provide tool and equipment manufacturers and suppliers an opportunity to display their products and services to potential clients
Book Synopsis 2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) by : IEEE Staff
Download or read book 2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) written by IEEE Staff and published by . This book was released on 2022-03-09 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The achievements in terms of operating frequency and integration of semiconductor technology are constantly creating new challenges in IC EMC, which must necessarily be addressed at both integrated circuits and system level Keeping up to date is of paramount importance to be successful in this field EMC Compo 2021 is intended to be a place for the exchange of the latest research achievements and experience in IC level EMC and it is addressed to researchers both from industry and from academia The most recent advances in simulation and measurement techniques, models, standards, tools, and design methodologies will be discussed A Technical Exhibition will provide tool and equipment manufacturers and suppliers an opportunity to display their products and services to potential clients
This proceedings volume provides a snapshot of the latest issues encountered in technical convergence and convergences of security technology. It explores how information science is core to most current research, industrial and commercial activities and consists of contributions covering topics including Ubiquitous Computing, Networks and Information Systems, Multimedia and Visualization, Middleware and Operating Systems, Security and Privacy, Data Mining and Artificial Intelligence, Software Engineering, and Web Technology. The proceedings introduce the most recent information technology and ideas, applications and problems related to technology convergence, illustrated through case studies, and reviews converging existing security techniques. Through this volume, readers will gain an understanding of the current state-of-the-art in information strategies and technologies of convergence security. The intended readership are researchers in academia, industry, and other research institutes focusing on information science and technology.
Book Synopsis Information Science and Applications by : Kuinam J. Kim
Download or read book Information Science and Applications written by Kuinam J. Kim and published by Springer. This book was released on 2015-02-17 with total page 1112 pages. Available in PDF, EPUB and Kindle. Book excerpt: This proceedings volume provides a snapshot of the latest issues encountered in technical convergence and convergences of security technology. It explores how information science is core to most current research, industrial and commercial activities and consists of contributions covering topics including Ubiquitous Computing, Networks and Information Systems, Multimedia and Visualization, Middleware and Operating Systems, Security and Privacy, Data Mining and Artificial Intelligence, Software Engineering, and Web Technology. The proceedings introduce the most recent information technology and ideas, applications and problems related to technology convergence, illustrated through case studies, and reviews converging existing security techniques. Through this volume, readers will gain an understanding of the current state-of-the-art in information strategies and technologies of convergence security. The intended readership are researchers in academia, industry, and other research institutes focusing on information science and technology.
Noise Coupling is the root-cause of the majority of Systems on Chip (SoC) product fails. The book discusses a breakthrough substrate coupling analysis flow and modelling toolset, addressing the needs of the design community. The flow provides capability to analyze noise components, propagating through the substrate, the parasitic interconnects and the package. Using this book, the reader can analyze and avoid complex noise coupling that degrades RF and mixed signal design performance, while reducing the need for conservative design practices. With chapters written by leading international experts in the field, novel methodologies are provided to identify noise coupling in silicon. It additionally features case studies that can be found in any modern CMOS SoC product for mobile communications, automotive applications and readout front ends.
Book Synopsis Noise Coupling in System-on-Chip by : Thomas Noulis
Download or read book Noise Coupling in System-on-Chip written by Thomas Noulis and published by CRC Press. This book was released on 2018-01-09 with total page 519 pages. Available in PDF, EPUB and Kindle. Book excerpt: Noise Coupling is the root-cause of the majority of Systems on Chip (SoC) product fails. The book discusses a breakthrough substrate coupling analysis flow and modelling toolset, addressing the needs of the design community. The flow provides capability to analyze noise components, propagating through the substrate, the parasitic interconnects and the package. Using this book, the reader can analyze and avoid complex noise coupling that degrades RF and mixed signal design performance, while reducing the need for conservative design practices. With chapters written by leading international experts in the field, novel methodologies are provided to identify noise coupling in silicon. It additionally features case studies that can be found in any modern CMOS SoC product for mobile communications, automotive applications and readout front ends.
Measurement and modeling of IC emissions and susceptibility, Signal Integrity and Power Integrity at IC and PCB level EMC aware IC Design and Guidelines, Tools to handle EMC at IC level Computational Electromagnetics for IC level EMC EMC issues in System on chip (SoC), System inPackage (SiP), and 3D ICs, EMC issues in smart power ICs EMC of ICs in wireless communications, EMC of ICs for biomedical applications, Materials for improved EMC of ICs, Harsh environment effects on IC level EMC, Long term electromagnetic robustness of ICs, Standards and regulations up to 6 GHz, Modern EMC education on IC level EMC, Influence of IC EMC on system design, Intentional Electromagnetic Interference
Book Synopsis 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) by : IEEE Staff
Download or read book 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) written by IEEE Staff and published by . This book was released on 2017-07-04 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Measurement and modeling of IC emissions and susceptibility, Signal Integrity and Power Integrity at IC and PCB level EMC aware IC Design and Guidelines, Tools to handle EMC at IC level Computational Electromagnetics for IC level EMC EMC issues in System on chip (SoC), System inPackage (SiP), and 3D ICs, EMC issues in smart power ICs EMC of ICs in wireless communications, EMC of ICs for biomedical applications, Materials for improved EMC of ICs, Harsh environment effects on IC level EMC, Long term electromagnetic robustness of ICs, Standards and regulations up to 6 GHz, Modern EMC education on IC level EMC, Influence of IC EMC on system design, Intentional Electromagnetic Interference
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Book Synopsis VLSI Design and Test for Systems Dependability by : Shojiro Asai
Download or read book VLSI Design and Test for Systems Dependability written by Shojiro Asai and published by Springer. This book was released on 2018-07-20 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
This collection of selected papers presented at the 11th International Conference on Scientific Computing in Electrical Engineering (SCEE), held in St. Wolfgang, Austria, in 2016, showcases the state of the art in SCEE. The aim of the SCEE 2016 conference was to bring together scientists from academia and industry, mathematicians, electrical engineers, computer scientists, and physicists, and to promote intensive discussions on industrially relevant mathematical problems, with an emphasis on the modeling and numerical simulation of electronic circuits and devices, electromagnetic fields, and coupled problems. The focus in methodology was on model order reduction and uncertainty quantification. This extensive reference work is divided into six parts: Computational Electromagnetics, Circuit and Device Modeling and Simulation, Coupled Problems and Multi‐Scale Approaches in Space and Time, Mathematical and Computational Methods Including Uncertainty Quantification, Model Order Reduction, and Industrial Applications. Each part starts with a general introduction, followed by the respective contributions. This book will appeal to mathematicians and electrical engineers. Further, it introduces algorithm and program developers to recent advances in the other fields, while industry experts will be introduced to new programming tools and mathematical methods.
Book Synopsis Scientific Computing in Electrical Engineering by : Ulrich Langer
Download or read book Scientific Computing in Electrical Engineering written by Ulrich Langer and published by Springer. This book was released on 2018-04-23 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: This collection of selected papers presented at the 11th International Conference on Scientific Computing in Electrical Engineering (SCEE), held in St. Wolfgang, Austria, in 2016, showcases the state of the art in SCEE. The aim of the SCEE 2016 conference was to bring together scientists from academia and industry, mathematicians, electrical engineers, computer scientists, and physicists, and to promote intensive discussions on industrially relevant mathematical problems, with an emphasis on the modeling and numerical simulation of electronic circuits and devices, electromagnetic fields, and coupled problems. The focus in methodology was on model order reduction and uncertainty quantification. This extensive reference work is divided into six parts: Computational Electromagnetics, Circuit and Device Modeling and Simulation, Coupled Problems and Multi‐Scale Approaches in Space and Time, Mathematical and Computational Methods Including Uncertainty Quantification, Model Order Reduction, and Industrial Applications. Each part starts with a general introduction, followed by the respective contributions. This book will appeal to mathematicians and electrical engineers. Further, it introduces algorithm and program developers to recent advances in the other fields, while industry experts will be introduced to new programming tools and mathematical methods.
