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Download or read book Electron Microscope Specimen Preparation Techniques in Materials Science written by K. C. Thompson-Russell and published by . This book was released on 1977 with total page 154 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author: Jeanne Ayache
Publisher: Springer Science & Business Media
Published: 2010-07-03
Total Pages: 267
ISBN-13: 0387981829
DOWNLOAD EBOOKSuccessful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Download or read book Sample Preparation Handbook for Transmission Electron Microscopy written by Jeanne Ayache and published by Springer Science & Business Media. This book was released on 2010-07-03 with total page 267 pages. Available in PDF, EPUB and Kindle. Book excerpt: Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Author: Jeanne Ayache
Publisher: Springer Science & Business Media
Published: 2010-06-08
Total Pages: 338
ISBN-13: 9781441959744
DOWNLOAD EBOOKSuccessful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti c literature detailing speci c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin specimen preparation have appeared until this present work, rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Download or read book Sample Preparation Handbook for Transmission Electron Microscopy written by Jeanne Ayache and published by Springer Science & Business Media. This book was released on 2010-06-08 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt: Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti c literature detailing speci c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin specimen preparation have appeared until this present work, rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Author: PJ Goodhew
Publisher: Garland Science
Published: 2020-11-25
Total Pages: 50
ISBN-13: 1000142760
DOWNLOAD EBOOKDetails the essential practical steps which must precede microscopy. Methods for preparing sheet or disc specimens and final thinning techniques are described with reference to practical problems. The book also covers methods for mounting specimens in the
Download or read book Specimen Preparation for Transmission Electron Microscopy of Materials written by PJ Goodhew and published by Garland Science. This book was released on 2020-11-25 with total page 50 pages. Available in PDF, EPUB and Kindle. Book excerpt: Details the essential practical steps which must precede microscopy. Methods for preparing sheet or disc specimens and final thinning techniques are described with reference to practical problems. The book also covers methods for mounting specimens in the
Download or read book Practical Methods in Electron Microscopy: pt. 1. Goodhew, P. J. Specimen preparation in materials science written by Audry M. Glauert and published by . This book was released on 1972 with total page 464 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author: Peter J. Goodhew
Publisher: North Holland
Published: 1973
Total Pages: 190
ISBN-13:
DOWNLOAD EBOOKDownload or read book Specimen Preparation in Materials Science written by Peter J. Goodhew and published by North Holland. This book was released on 1973 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author: Peter J. Goodhew
Publisher: Garland Science
Published: 1984
Total Pages: 56
ISBN-13:
DOWNLOAD EBOOKDetails the essential practical steps which must precede microscopy. Methods for preparing sheet or disc specimens and final thinning techniques are described with reference to practical problems. The book also covers methods for mounting specimens in the
Download or read book Specimen Preparation for Transmission Electron Microscopy of Materials written by Peter J. Goodhew and published by Garland Science. This book was released on 1984 with total page 56 pages. Available in PDF, EPUB and Kindle. Book excerpt: Details the essential practical steps which must precede microscopy. Methods for preparing sheet or disc specimens and final thinning techniques are described with reference to practical problems. The book also covers methods for mounting specimens in the
Author: Audrey M. Glauert
Publisher:
Published: 1972
Total Pages: 0
ISBN-13: 9780720442519
DOWNLOAD EBOOKDownload or read book Practical Methods in Electron Microscopy written by Audrey M. Glauert and published by . This book was released on 1972 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author: Xiao-Feng Zhang
Publisher: Springer Science & Business Media
Published: 2001-10-18
Total Pages: 342
ISBN-13: 9783540676812
DOWNLOAD EBOOKTransmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume 2 illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Download or read book Progress in Transmission Electron Microscopy 2 written by Xiao-Feng Zhang and published by Springer Science & Business Media. This book was released on 2001-10-18 with total page 342 pages. Available in PDF, EPUB and Kindle. Book excerpt: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume 2 illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Author: Patrick Echlin
Publisher: Springer Science & Business Media
Published: 2011-04-14
Total Pages: 329
ISBN-13: 0387857311
DOWNLOAD EBOOKScanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Download or read book Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2011-04-14 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
