Material Characterization Using Electron Holography

Material Characterization Using Electron Holography

Author: Daisuke Shindo

Publisher: John Wiley & Sons

Published: 2022-08-24

Total Pages: 244

ISBN-13: 3527829709

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Material Characterization using Electron Holography Exploration of a unique technique that offers exciting possibilities to analyze electromagnetic behavior of materials Material Characterization using Electron Holography addresses how the electromagnetic field can be directly visualized and precisely interpreted based on Maxwell’s equations formulated by special relativity, leading to the understanding of electromagnetic properties of advanced materials and devices. In doing so, it delivers a unique route to imaging materials in higher resolution. The focus of the book is on in situ observation of electromagnetic fields of diverse functional materials. Furthermore, an extension of electron holographic techniques, such as direct observation of accumulation and collective motions of electrons around the charged insulators, is also explained. This approach enables the reader to develop a deeper understanding of functionalities of advanced materials. Written by two highly qualified authors with extensive first-hand experience in the field, Material Characterization using Electron Holography covers topics such as: Importance of electromagnetic fields and their visualization, Maxwell’s equations formulated by special relativity, and de Broglie waves and wave functions Outlines of general relativity and Einstein’s equations, principles of electron holography, and related techniques Simulation of holograms and visualized electromagnetic fields, electric field analysis, and in situ observation of electric fields Interaction between electrons and charged specimen surfaces and interpretation of visualization of collective motions of electrons For materials scientists, analytical chemists, structural chemists, analytical research institutes, applied physicists, physicists, semiconductor physicists, and libraries looking to be on the cutting edge of methods to analyze electromagnetic behavior of materials, Material Characterization using Electron Holography offers comprehensive coverage of the subject from authoritative and forward-thinking topical experts.


Book Synopsis Material Characterization Using Electron Holography by : Daisuke Shindo

Download or read book Material Characterization Using Electron Holography written by Daisuke Shindo and published by John Wiley & Sons. This book was released on 2022-08-24 with total page 244 pages. Available in PDF, EPUB and Kindle. Book excerpt: Material Characterization using Electron Holography Exploration of a unique technique that offers exciting possibilities to analyze electromagnetic behavior of materials Material Characterization using Electron Holography addresses how the electromagnetic field can be directly visualized and precisely interpreted based on Maxwell’s equations formulated by special relativity, leading to the understanding of electromagnetic properties of advanced materials and devices. In doing so, it delivers a unique route to imaging materials in higher resolution. The focus of the book is on in situ observation of electromagnetic fields of diverse functional materials. Furthermore, an extension of electron holographic techniques, such as direct observation of accumulation and collective motions of electrons around the charged insulators, is also explained. This approach enables the reader to develop a deeper understanding of functionalities of advanced materials. Written by two highly qualified authors with extensive first-hand experience in the field, Material Characterization using Electron Holography covers topics such as: Importance of electromagnetic fields and their visualization, Maxwell’s equations formulated by special relativity, and de Broglie waves and wave functions Outlines of general relativity and Einstein’s equations, principles of electron holography, and related techniques Simulation of holograms and visualized electromagnetic fields, electric field analysis, and in situ observation of electric fields Interaction between electrons and charged specimen surfaces and interpretation of visualization of collective motions of electrons For materials scientists, analytical chemists, structural chemists, analytical research institutes, applied physicists, physicists, semiconductor physicists, and libraries looking to be on the cutting edge of methods to analyze electromagnetic behavior of materials, Material Characterization using Electron Holography offers comprehensive coverage of the subject from authoritative and forward-thinking topical experts.

Material Characterization Using Electron Holography

Material Characterization Using Electron Holography

Author: Daisuke Shindo

Publisher: John Wiley & Sons

Published: 2022-10-17

Total Pages: 244

ISBN-13: 3527348042

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Material Characterization using Electron Holography Exploration of a unique technique that offers exciting possibilities to analyze electromagnetic behavior of materials Material Characterization using Electron Holography addresses how the electromagnetic field can be directly visualized and precisely interpreted based on Maxwell’s equations formulated by special relativity, leading to the understanding of electromagnetic properties of advanced materials and devices. In doing so, it delivers a unique route to imaging materials in higher resolution. The focus of the book is on in situ observation of electromagnetic fields of diverse functional materials. Furthermore, an extension of electron holographic techniques, such as direct observation of accumulation and collective motions of electrons around the charged insulators, is also explained. This approach enables the reader to develop a deeper understanding of functionalities of advanced materials. Written by two highly qualified authors with extensive first-hand experience in the field, Material Characterization using Electron Holography covers topics such as: Importance of electromagnetic fields and their visualization, Maxwell’s equations formulated by special relativity, and de Broglie waves and wave functions Outlines of general relativity and Einstein’s equations, principles of electron holography, and related techniques Simulation of holograms and visualized electromagnetic fields, electric field analysis, and in situ observation of electric fields Interaction between electrons and charged specimen surfaces and interpretation of visualization of collective motions of electrons For materials scientists, analytical chemists, structural chemists, analytical research institutes, applied physicists, physicists, semiconductor physicists, and libraries looking to be on the cutting edge of methods to analyze electromagnetic behavior of materials, Material Characterization using Electron Holography offers comprehensive coverage of the subject from authoritative and forward-thinking topical experts.


Book Synopsis Material Characterization Using Electron Holography by : Daisuke Shindo

Download or read book Material Characterization Using Electron Holography written by Daisuke Shindo and published by John Wiley & Sons. This book was released on 2022-10-17 with total page 244 pages. Available in PDF, EPUB and Kindle. Book excerpt: Material Characterization using Electron Holography Exploration of a unique technique that offers exciting possibilities to analyze electromagnetic behavior of materials Material Characterization using Electron Holography addresses how the electromagnetic field can be directly visualized and precisely interpreted based on Maxwell’s equations formulated by special relativity, leading to the understanding of electromagnetic properties of advanced materials and devices. In doing so, it delivers a unique route to imaging materials in higher resolution. The focus of the book is on in situ observation of electromagnetic fields of diverse functional materials. Furthermore, an extension of electron holographic techniques, such as direct observation of accumulation and collective motions of electrons around the charged insulators, is also explained. This approach enables the reader to develop a deeper understanding of functionalities of advanced materials. Written by two highly qualified authors with extensive first-hand experience in the field, Material Characterization using Electron Holography covers topics such as: Importance of electromagnetic fields and their visualization, Maxwell’s equations formulated by special relativity, and de Broglie waves and wave functions Outlines of general relativity and Einstein’s equations, principles of electron holography, and related techniques Simulation of holograms and visualized electromagnetic fields, electric field analysis, and in situ observation of electric fields Interaction between electrons and charged specimen surfaces and interpretation of visualization of collective motions of electrons For materials scientists, analytical chemists, structural chemists, analytical research institutes, applied physicists, physicists, semiconductor physicists, and libraries looking to be on the cutting edge of methods to analyze electromagnetic behavior of materials, Material Characterization using Electron Holography offers comprehensive coverage of the subject from authoritative and forward-thinking topical experts.

In-situ Materials Characterization

In-situ Materials Characterization

Author: Alexander Ziegler

Publisher: Springer Science & Business Media

Published: 2014-04-01

Total Pages: 265

ISBN-13: 3642451527

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The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.


Book Synopsis In-situ Materials Characterization by : Alexander Ziegler

Download or read book In-situ Materials Characterization written by Alexander Ziegler and published by Springer Science & Business Media. This book was released on 2014-04-01 with total page 265 pages. Available in PDF, EPUB and Kindle. Book excerpt: The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.

Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy

Author: Nigel D. Browning

Publisher: Cambridge University Press

Published: 2000-07-06

Total Pages: 409

ISBN-13: 1139429167

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This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.


Book Synopsis Characterization of High Tc Materials and Devices by Electron Microscopy by : Nigel D. Browning

Download or read book Characterization of High Tc Materials and Devices by Electron Microscopy written by Nigel D. Browning and published by Cambridge University Press. This book was released on 2000-07-06 with total page 409 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.

Introduction to Electron Holography

Introduction to Electron Holography

Author: Edgar Völkl

Publisher: Springer Science & Business Media

Published: 2013-11-11

Total Pages: 362

ISBN-13: 1461548179

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Experienced and novice holographers receive a solid foundation in the theory and practice of holography, the next generation of imaging technology, in this superb text. The book's `how to' aspects enable readers to learn hologram acquisition at the microscope and processing of holograms at the computer as well as digital imaging techniques. A complete bibliography on electron holography and applications of the method to problems in materials science, physics and the life sciences round out the volume's coverage.


Book Synopsis Introduction to Electron Holography by : Edgar Völkl

Download or read book Introduction to Electron Holography written by Edgar Völkl and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: Experienced and novice holographers receive a solid foundation in the theory and practice of holography, the next generation of imaging technology, in this superb text. The book's `how to' aspects enable readers to learn hologram acquisition at the microscope and processing of holograms at the computer as well as digital imaging techniques. A complete bibliography on electron holography and applications of the method to problems in materials science, physics and the life sciences round out the volume's coverage.

Encyclopedia of Materials Characterization

Encyclopedia of Materials Characterization

Author: Charles A. Evans

Publisher: Gulf Professional Publishing

Published: 1992

Total Pages: 784

ISBN-13: 9780750691680

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"This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series."--Knovel.


Book Synopsis Encyclopedia of Materials Characterization by : Charles A. Evans

Download or read book Encyclopedia of Materials Characterization written by Charles A. Evans and published by Gulf Professional Publishing. This book was released on 1992 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series."--Knovel.

Analytical Electron Microscopy for Materials Science

Analytical Electron Microscopy for Materials Science

Author: DAISUKE Shindo

Publisher: Springer Science & Business Media

Published: 2013-04-17

Total Pages: 162

ISBN-13: 4431669884

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Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.


Book Synopsis Analytical Electron Microscopy for Materials Science by : DAISUKE Shindo

Download or read book Analytical Electron Microscopy for Materials Science written by DAISUKE Shindo and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

Handbook of Polymer Synthesis, Characterization, and Processing

Handbook of Polymer Synthesis, Characterization, and Processing

Author: Enrique Saldivar-Guerra

Publisher: John Wiley & Sons

Published: 2013-03-04

Total Pages: 660

ISBN-13: 0470630329

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Covering a broad range of polymer science topics, Handbook of Polymer Synthesis, Characterization, and Processing provides polymer industry professionals and researchers in polymer science and technology with a single, comprehensive handbook summarizing all aspects involved in the polymer production chain. The handbook focuses on industrially important polymers, analytical techniques, and formulation methods, with chapters covering step-growth, radical, and co-polymerization, crosslinking and grafting, reaction engineering, advanced technology applications, including conjugated, dendritic, and nanomaterial polymers and emulsions, and characterization methods, including spectroscopy, light scattering, and microscopy.


Book Synopsis Handbook of Polymer Synthesis, Characterization, and Processing by : Enrique Saldivar-Guerra

Download or read book Handbook of Polymer Synthesis, Characterization, and Processing written by Enrique Saldivar-Guerra and published by John Wiley & Sons. This book was released on 2013-03-04 with total page 660 pages. Available in PDF, EPUB and Kindle. Book excerpt: Covering a broad range of polymer science topics, Handbook of Polymer Synthesis, Characterization, and Processing provides polymer industry professionals and researchers in polymer science and technology with a single, comprehensive handbook summarizing all aspects involved in the polymer production chain. The handbook focuses on industrially important polymers, analytical techniques, and formulation methods, with chapters covering step-growth, radical, and co-polymerization, crosslinking and grafting, reaction engineering, advanced technology applications, including conjugated, dendritic, and nanomaterial polymers and emulsions, and characterization methods, including spectroscopy, light scattering, and microscopy.

Scanning Transmission Electron Microscopy

Scanning Transmission Electron Microscopy

Author: Alina Bruma

Publisher: CRC Press

Published: 2020-12-22

Total Pages: 162

ISBN-13: 0429516169

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Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.


Book Synopsis Scanning Transmission Electron Microscopy by : Alina Bruma

Download or read book Scanning Transmission Electron Microscopy written by Alina Bruma and published by CRC Press. This book was released on 2020-12-22 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.

Principles of Materials Characterization and Metrology

Principles of Materials Characterization and Metrology

Author: Kannan M. Krishnan

Publisher: Oxford University Press

Published: 2021

Total Pages: 869

ISBN-13: 0198830254

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Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.


Book Synopsis Principles of Materials Characterization and Metrology by : Kannan M. Krishnan

Download or read book Principles of Materials Characterization and Metrology written by Kannan M. Krishnan and published by Oxford University Press. This book was released on 2021 with total page 869 pages. Available in PDF, EPUB and Kindle. Book excerpt: Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.