Science of Microscopy

Science of Microscopy

Author: P.W. Hawkes

Publisher: Springer Science & Business Media

Published: 2008-08-29

Total Pages: 1336

ISBN-13: 0387497625

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This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.


Book Synopsis Science of Microscopy by : P.W. Hawkes

Download or read book Science of Microscopy written by P.W. Hawkes and published by Springer Science & Business Media. This book was released on 2008-08-29 with total page 1336 pages. Available in PDF, EPUB and Kindle. Book excerpt: This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.


Microscopy Techniques for Materials Science

Microscopy Techniques for Materials Science

Author: A Clarke

Publisher: Elsevier

Published: 2002-10-29

Total Pages: 455

ISBN-13: 1855737507

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This comprehensive reference work provides an overview of, and practical guide to, the various computer-aided microscopical techniques used in materials science today. After introducing the reader to the basic concepts of optics, the interactions between light and matter, and image processing, the book goes on to discuss in depth both 2D reflection microscopy and confocal laser scanning microscopy. The application of these techniques to the characterisation of materials is abundantly illustrated by hundreds of photographs and illustrations, and through specific case studies. There is also discussion of other modern optical imaging techniques and of non-optical ones such as x-ray micrography. This reference text is essential both for beginners looking for an introduction to the subject as well as advanced materials researchers in the fields where optical microscopy is used. Major reference work on the application of microscopy techniques to materials science research Includes over 420 photographs and illustrations Provides detailed coverage of the major light microscopical techniques including optical reflection microscopy and confocal laser scanning microscopy as well as novel techniques such raman microscopy, tomography and microtomography


Book Synopsis Microscopy Techniques for Materials Science by : A Clarke

Download or read book Microscopy Techniques for Materials Science written by A Clarke and published by Elsevier. This book was released on 2002-10-29 with total page 455 pages. Available in PDF, EPUB and Kindle. Book excerpt: This comprehensive reference work provides an overview of, and practical guide to, the various computer-aided microscopical techniques used in materials science today. After introducing the reader to the basic concepts of optics, the interactions between light and matter, and image processing, the book goes on to discuss in depth both 2D reflection microscopy and confocal laser scanning microscopy. The application of these techniques to the characterisation of materials is abundantly illustrated by hundreds of photographs and illustrations, and through specific case studies. There is also discussion of other modern optical imaging techniques and of non-optical ones such as x-ray micrography. This reference text is essential both for beginners looking for an introduction to the subject as well as advanced materials researchers in the fields where optical microscopy is used. Major reference work on the application of microscopy techniques to materials science research Includes over 420 photographs and illustrations Provides detailed coverage of the major light microscopical techniques including optical reflection microscopy and confocal laser scanning microscopy as well as novel techniques such raman microscopy, tomography and microtomography


Analytical Electron Microscopy for Materials Science

Analytical Electron Microscopy for Materials Science

Author: DAISUKE Shindo

Publisher: Springer Science & Business Media

Published: 2013-04-17

Total Pages: 162

ISBN-13: 4431669884

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Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.


Book Synopsis Analytical Electron Microscopy for Materials Science by : DAISUKE Shindo

Download or read book Analytical Electron Microscopy for Materials Science written by DAISUKE Shindo and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.


Basic Methods in Microscopy

Basic Methods in Microscopy

Author: David L. Spector

Publisher: CSHL Press

Published: 2006

Total Pages: 384

ISBN-13: 0879697512

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This manual contains selected material from Cells - a Laboratory Manual, as well as two chapters from Live Cell Imaging. It includes sections on microscopy, and on preparing and labelling specimens for microscopy.


Book Synopsis Basic Methods in Microscopy by : David L. Spector

Download or read book Basic Methods in Microscopy written by David L. Spector and published by CSHL Press. This book was released on 2006 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: This manual contains selected material from Cells - a Laboratory Manual, as well as two chapters from Live Cell Imaging. It includes sections on microscopy, and on preparing and labelling specimens for microscopy.


Video Microscopy

Video Microscopy

Author: Shinya Inoue

Publisher: Springer Science & Business Media

Published: 2013-11-11

Total Pages: 600

ISBN-13: 1475769253

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Ever since television became practical in the early 1950s, closed-circuit television (CCTV) in conjunction with the light microscope has provided large screen display, raised image contrast, and made the images formed by ultraviolet and infrared rays visible. With the introduction of large-scale integrated circuits in the last decade, TV equipment has improved by leaps and bounds, as has its application in microscopy. With modem CCTV, sometimes with the help of digital computers, we can distill the image from a scene that appears to be nothing but noise; capture fluorescence too dim to be seen; visualize structures far below the limit of resolution; crispen images hidden in fog; measure, count, and sort objects; and record in time-lapsed and high-speed sequences through the light microscope without great difficulty. In fact, video is becoming indispensable for harnessing the fullest capacity of the light microscope, a capacity that itself is much greater than could have been envisioned just a few years ago. The time seemed ripe then to review the basics of video, and of microscopy, and to examine how the two could best be combined to accomplish these tasks. The Marine Biological Laboratory short courses on Analytical and Quantitative Light Microscopy in Biology, Medicine, and the Materials Sciences, and the many inquiries I received on video microscopy, supported such an effort, and Kirk Jensen of Plenum Press persuaded me of its worth.


Book Synopsis Video Microscopy by : Shinya Inoue

Download or read book Video Microscopy written by Shinya Inoue and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 600 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ever since television became practical in the early 1950s, closed-circuit television (CCTV) in conjunction with the light microscope has provided large screen display, raised image contrast, and made the images formed by ultraviolet and infrared rays visible. With the introduction of large-scale integrated circuits in the last decade, TV equipment has improved by leaps and bounds, as has its application in microscopy. With modem CCTV, sometimes with the help of digital computers, we can distill the image from a scene that appears to be nothing but noise; capture fluorescence too dim to be seen; visualize structures far below the limit of resolution; crispen images hidden in fog; measure, count, and sort objects; and record in time-lapsed and high-speed sequences through the light microscope without great difficulty. In fact, video is becoming indispensable for harnessing the fullest capacity of the light microscope, a capacity that itself is much greater than could have been envisioned just a few years ago. The time seemed ripe then to review the basics of video, and of microscopy, and to examine how the two could best be combined to accomplish these tasks. The Marine Biological Laboratory short courses on Analytical and Quantitative Light Microscopy in Biology, Medicine, and the Materials Sciences, and the many inquiries I received on video microscopy, supported such an effort, and Kirk Jensen of Plenum Press persuaded me of its worth.


Transmission Electron Microscopy

Transmission Electron Microscopy

Author: David B. Williams

Publisher: Springer Science & Business Media

Published: 2013-03-09

Total Pages: 708

ISBN-13: 1475725191

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Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.


Book Synopsis Transmission Electron Microscopy by : David B. Williams

Download or read book Transmission Electron Microscopy written by David B. Williams and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.


Transmission Electron Microscopy

Transmission Electron Microscopy

Author: Ludwig Reimer

Publisher: Springer

Published: 2013-11-11

Total Pages: 532

ISBN-13: 3662135531

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The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.


Book Synopsis Transmission Electron Microscopy by : Ludwig Reimer

Download or read book Transmission Electron Microscopy written by Ludwig Reimer and published by Springer. This book was released on 2013-11-11 with total page 532 pages. Available in PDF, EPUB and Kindle. Book excerpt: The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.


Introduction to Optical Microscopy

Introduction to Optical Microscopy

Author: Jerome Mertz

Publisher: Cambridge University Press

Published: 2019-08

Total Pages: 475

ISBN-13: 1108428304

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Presents a fully updated, self-contained textbook covering the core theory and practice of both classical and modern optical microscopy techniques.


Book Synopsis Introduction to Optical Microscopy by : Jerome Mertz

Download or read book Introduction to Optical Microscopy written by Jerome Mertz and published by Cambridge University Press. This book was released on 2019-08 with total page 475 pages. Available in PDF, EPUB and Kindle. Book excerpt: Presents a fully updated, self-contained textbook covering the core theory and practice of both classical and modern optical microscopy techniques.


High-Resolution Electron Microscopy for Materials Science

High-Resolution Electron Microscopy for Materials Science

Author: Daisuke Shindo

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 196

ISBN-13: 4431684220

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High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.


Book Synopsis High-Resolution Electron Microscopy for Materials Science by : Daisuke Shindo

Download or read book High-Resolution Electron Microscopy for Materials Science written by Daisuke Shindo and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 196 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.


Scanning Electron Microscopy

Scanning Electron Microscopy

Author: Ludwig Reimer

Publisher: Springer

Published: 2013-11-11

Total Pages: 538

ISBN-13: 3540389679

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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.


Book Synopsis Scanning Electron Microscopy by : Ludwig Reimer

Download or read book Scanning Electron Microscopy written by Ludwig Reimer and published by Springer. This book was released on 2013-11-11 with total page 538 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.