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A reference on semiconductor characterization tools, this volume offers explanations of the advanced and traditional techniques for evaluating different criterion: crystal defects, impurity concentration, lifetime, film thickness, resistivity, and such critical electrical properties as mobility, Hall effect, and conductivity type.
Book Synopsis Semiconductor Measurements and Instrumentation by : W. R. Runyan
Download or read book Semiconductor Measurements and Instrumentation written by W. R. Runyan and published by McGraw Hill Professional. This book was released on 1998 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: A reference on semiconductor characterization tools, this volume offers explanations of the advanced and traditional techniques for evaluating different criterion: crystal defects, impurity concentration, lifetime, film thickness, resistivity, and such critical electrical properties as mobility, Hall effect, and conductivity type.
Crystal orientation. Crystallographic defects and their observation. Resistivity and carrier-concentration measurements. Lifetime. Mobility, hall, and type measurements. Thickness measurements. Preparation of samples for microscopic examination. Microscopy and photography. The electron microscope and other analytical instruments.
Book Synopsis Semiconductor Measurements and Instrumentation by : W. R. Runyan
Download or read book Semiconductor Measurements and Instrumentation written by W. R. Runyan and published by McGraw-Hill Companies. This book was released on 1975 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crystal orientation. Crystallographic defects and their observation. Resistivity and carrier-concentration measurements. Lifetime. Mobility, hall, and type measurements. Thickness measurements. Preparation of samples for microscopic examination. Microscopy and photography. The electron microscope and other analytical instruments.
As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.
Book Synopsis Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization by : Richard Haight
Download or read book Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization written by Richard Haight and published by World Scientific. This book was released on 2012 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt: As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Measurement and Instrumentation: Theory and Application, Second Edition, introduces undergraduate engineering students to measurement principles and the range of sensors and instruments used for measuring physical variables. This updated edition provides new coverage of the latest developments in measurement technologies, including smart sensors, intelligent instruments, microsensors, digital recorders, displays, and interfaces, also featuring chapters on data acquisition and signal processing with LabVIEW from Dr. Reza Langari. Written clearly and comprehensively, this text provides students and recently graduated engineers with the knowledge and tools to design and build measurement systems for virtually any engineering application. Provides early coverage of measurement system design to facilitate a better framework for understanding the importance of studying measurement and instrumentation Covers the latest developments in measurement technologies, including smart sensors, intelligent instruments, microsensors, digital recorders, displays, and interfaces Includes significant material on data acquisition and signal processing with LabVIEW Extensive coverage of measurement uncertainty aids students’ ability to determine the accuracy of instruments and measurement systems
Book Synopsis Measurement and Instrumentation by : Alan S. Morris
Download or read book Measurement and Instrumentation written by Alan S. Morris and published by Academic Press. This book was released on 2015-08-13 with total page 727 pages. Available in PDF, EPUB and Kindle. Book excerpt: Measurement and Instrumentation: Theory and Application, Second Edition, introduces undergraduate engineering students to measurement principles and the range of sensors and instruments used for measuring physical variables. This updated edition provides new coverage of the latest developments in measurement technologies, including smart sensors, intelligent instruments, microsensors, digital recorders, displays, and interfaces, also featuring chapters on data acquisition and signal processing with LabVIEW from Dr. Reza Langari. Written clearly and comprehensively, this text provides students and recently graduated engineers with the knowledge and tools to design and build measurement systems for virtually any engineering application. Provides early coverage of measurement system design to facilitate a better framework for understanding the importance of studying measurement and instrumentation Covers the latest developments in measurement technologies, including smart sensors, intelligent instruments, microsensors, digital recorders, displays, and interfaces Includes significant material on data acquisition and signal processing with LabVIEW Extensive coverage of measurement uncertainty aids students’ ability to determine the accuracy of instruments and measurement systems
Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay
Book Synopsis Handbook of Silicon Semiconductor Metrology by : Alain C. Diebold
Download or read book Handbook of Silicon Semiconductor Metrology written by Alain C. Diebold and published by CRC Press. This book was released on 2001-06-29 with total page 703 pages. Available in PDF, EPUB and Kindle. Book excerpt: Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay
Book Synopsis Semiconductor Measurement Technology by : United States. National Bureau of Standards
Download or read book Semiconductor Measurement Technology written by United States. National Bureau of Standards and published by . This book was released on 1983 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt:
This book describes the fundamental scientific principles underlying high quality instrumentation used for environmental measurements. It discusses a wide range of in situ sensors employed in practical environmental monitoring and, in particular, those used in surface based measurement systems. It also considers the use of weather balloons to provide a wealth of upper atmosphere data. To illustrate the technologies in use it includes many examples of real atmospheric measurements in typical and unusual circumstances, with a discussion of the electronic signal conditioning, data acquisition considerations and data processing principles necessary for reliable measurements. This also allows the long history of atmospheric measurements to be placed in the context of the requirements of modern climate science, by building the physical science appreciation of the instrumental record and looking forward to new and emerging sensor and recording technologies.
Book Synopsis Meteorological Measurements and Instrumentation by : Giles Harrison
Download or read book Meteorological Measurements and Instrumentation written by Giles Harrison and published by John Wiley & Sons. This book was released on 2015-01-20 with total page 291 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the fundamental scientific principles underlying high quality instrumentation used for environmental measurements. It discusses a wide range of in situ sensors employed in practical environmental monitoring and, in particular, those used in surface based measurement systems. It also considers the use of weather balloons to provide a wealth of upper atmosphere data. To illustrate the technologies in use it includes many examples of real atmospheric measurements in typical and unusual circumstances, with a discussion of the electronic signal conditioning, data acquisition considerations and data processing principles necessary for reliable measurements. This also allows the long history of atmospheric measurements to be placed in the context of the requirements of modern climate science, by building the physical science appreciation of the instrumental record and looking forward to new and emerging sensor and recording technologies.
This book is concerned with compound semiconductor bulk materials and has been written for students, researchers and engineers in material science and device fabrication. It offers them the elementary and intermediate knowledge of compound semiconductor bulk materials necessary for entering this field. In the first part, the book describes the physical properties, crystal growth technologies, principles of crystal growth, various defects in crystals, characterization techniques and applications. In the second and the third parts, the book reviews various compound semiconductor materials, including important industrial materials and the results of recent research.
Book Synopsis Compound Semiconductor Bulk Materials and Characterizations by : Osamu Oda
Download or read book Compound Semiconductor Bulk Materials and Characterizations written by Osamu Oda and published by World Scientific. This book was released on 2007 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is concerned with compound semiconductor bulk materials and has been written for students, researchers and engineers in material science and device fabrication. It offers them the elementary and intermediate knowledge of compound semiconductor bulk materials necessary for entering this field. In the first part, the book describes the physical properties, crystal growth technologies, principles of crystal growth, various defects in crystals, characterization techniques and applications. In the second and the third parts, the book reviews various compound semiconductor materials, including important industrial materials and the results of recent research.
Book Synopsis Semiconductor Measurement Technology by : National Institute of Standards and Technology (U.S.)
Download or read book Semiconductor Measurement Technology written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1990 with total page 128 pages. Available in PDF, EPUB and Kindle. Book excerpt:
