Surface Analysis with STM and AFM

Surface Analysis with STM and AFM

Author: Sergei N. Magonov

Publisher: John Wiley & Sons

Published: 2008-09-26

Total Pages: 335

ISBN-13: 3527615105

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Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.


Book Synopsis Surface Analysis with STM and AFM by : Sergei N. Magonov

Download or read book Surface Analysis with STM and AFM written by Sergei N. Magonov and published by John Wiley & Sons. This book was released on 2008-09-26 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.

Experimental Methods in Tribology

Experimental Methods in Tribology

Author: Gwidon Stachowiak

Publisher: Elsevier

Published: 2004-05-18

Total Pages: 372

ISBN-13: 9780080472737

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This is an indespensible guide to both researchers in academia and industry who wish to perform tribological experiments more effectively. With an extensive range of illustrations which communicate the basic concepts in experimental methods tribology more effectively than text alone. An extensive citation list is also provided at the end of each chapter facilitating a more thorough navigation through a particular subject. * Contains extensive illustrations * Highlights limitations of current techniques


Book Synopsis Experimental Methods in Tribology by : Gwidon Stachowiak

Download or read book Experimental Methods in Tribology written by Gwidon Stachowiak and published by Elsevier. This book was released on 2004-05-18 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is an indespensible guide to both researchers in academia and industry who wish to perform tribological experiments more effectively. With an extensive range of illustrations which communicate the basic concepts in experimental methods tribology more effectively than text alone. An extensive citation list is also provided at the end of each chapter facilitating a more thorough navigation through a particular subject. * Contains extensive illustrations * Highlights limitations of current techniques

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

Author: Alvin W. Czanderna

Publisher: Springer Science & Business Media

Published: 2006-04-11

Total Pages: 447

ISBN-13: 0306469146

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Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.


Book Synopsis Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis by : Alvin W. Czanderna

Download or read book Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis written by Alvin W. Czanderna and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 447 pages. Available in PDF, EPUB and Kindle. Book excerpt: Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

Atomic Force Microscopy/Scanning Tunneling Microscopy 3

Atomic Force Microscopy/Scanning Tunneling Microscopy 3

Author: Samuel H. Cohen

Publisher: Springer Science & Business Media

Published: 2007-05-08

Total Pages: 208

ISBN-13: 0306470950

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The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day’s sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.


Book Synopsis Atomic Force Microscopy/Scanning Tunneling Microscopy 3 by : Samuel H. Cohen

Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy 3 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day’s sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.

Proceedings of the Symposium on the Application of Surface Analysis Methods to Environmental/Material Interactions

Proceedings of the Symposium on the Application of Surface Analysis Methods to Environmental/Material Interactions

Author: Donald Ray Baer

Publisher:

Published: 1991

Total Pages: 580

ISBN-13:

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Book Synopsis Proceedings of the Symposium on the Application of Surface Analysis Methods to Environmental/Material Interactions by : Donald Ray Baer

Download or read book Proceedings of the Symposium on the Application of Surface Analysis Methods to Environmental/Material Interactions written by Donald Ray Baer and published by . This book was released on 1991 with total page 580 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Ultraclean Surface Processing of Silicon Wafers

Ultraclean Surface Processing of Silicon Wafers

Author: Takeshi Hattori

Publisher: Springer Science & Business Media

Published: 2013-03-09

Total Pages: 634

ISBN-13: 3662035359

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A totally new concept for clean surface processing of Si wafers is introduced in this book. Some fifty distinguished researchers and engineers from the leading Japanese semiconductor companies, such as NEC, Hitachi, Toshiba, Sony and Panasonic as well as from several universities reveal to us for the first time the secrets of these highly productive institutions. They describe the techniques and equipment necessary for the preparation of clean high-quality semiconductor surfaces as a first step in high-yield/high-quality device production. This book thus opens the door to the manufacturing of reliable nanoscale devices and will be extremely useful for every engineer, physicist and technician involved in the production of silicon semiconductor devices.


Book Synopsis Ultraclean Surface Processing of Silicon Wafers by : Takeshi Hattori

Download or read book Ultraclean Surface Processing of Silicon Wafers written by Takeshi Hattori and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 634 pages. Available in PDF, EPUB and Kindle. Book excerpt: A totally new concept for clean surface processing of Si wafers is introduced in this book. Some fifty distinguished researchers and engineers from the leading Japanese semiconductor companies, such as NEC, Hitachi, Toshiba, Sony and Panasonic as well as from several universities reveal to us for the first time the secrets of these highly productive institutions. They describe the techniques and equipment necessary for the preparation of clean high-quality semiconductor surfaces as a first step in high-yield/high-quality device production. This book thus opens the door to the manufacturing of reliable nanoscale devices and will be extremely useful for every engineer, physicist and technician involved in the production of silicon semiconductor devices.

Corrosion Science

Corrosion Science

Author: Gerald S. Frankel

Publisher: The Electrochemical Society

Published: 2002

Total Pages: 630

ISBN-13: 9781566773355

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Book Synopsis Corrosion Science by : Gerald S. Frankel

Download or read book Corrosion Science written by Gerald S. Frankel and published by The Electrochemical Society. This book was released on 2002 with total page 630 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Surface Analysis Methods in Materials Science

Surface Analysis Methods in Materials Science

Author: D.J. O'Connor

Publisher: Springer Science & Business Media

Published: 2013-06-29

Total Pages: 588

ISBN-13: 366205227X

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This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.


Book Synopsis Surface Analysis Methods in Materials Science by : D.J. O'Connor

Download or read book Surface Analysis Methods in Materials Science written by D.J. O'Connor and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 588 pages. Available in PDF, EPUB and Kindle. Book excerpt: This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.

Fundamentals of Environmental Sampling and Analysis

Fundamentals of Environmental Sampling and Analysis

Author: Chunlong Zhang

Publisher: John Wiley & Sons

Published: 2024-07-03

Total Pages: 180

ISBN-13: 139424164X

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This is the Solutions Manual to accompany Fundamentals of Environmental Sampling and Analysis, Second Edition. It provides solutions to the exercises and problems found in the main volume This book introduces a comprehensive overview on the fundamentals and applications of environmental sampling and analysis for students in environmental science and engineering as well as environmental professionals involved in sampling and analytical work. The book details fundamentals of sampling, selection of standard methods, QA/QC, sample preparation, chemical and instrumental principles, and method applications to various contaminants in environmental matrices (air, water, soil, waste, and biological samples). The book gives an integrated introduction to sampling and analysis – both are essential to quality environmental data. For example, contrary to other books that introduce a specific area of sampling and analysis, this text provides a balanced mix of field sampling and laboratory analysis, essential knowledge in chemistry/statistics/hydrology/regulations, wet chemical methods for conventional chemicals as well as various modern instrumental techniques for contaminants of emerging concerns. The new edition adds three standalone chapters regarding the basics of analytical and organic chemistry, environmental data analysis, mass spectrometry and other significant amounts of new materials such as time-integrated passive sampling, incremental sampling, green sample preparation, Raman spectroscopy, chiral separation, and non-target analysis. In addition, the second edition provides more examples, visual aids, case studies, and end-of-chapter exercise problems to enhance a better understanding of the fundamentals of environmental sampling and analysis while incorporating current literature (mostly peer-reviewed journal papers) regarding the applications and challenges in the field of environmental sampling and analysis.


Book Synopsis Fundamentals of Environmental Sampling and Analysis by : Chunlong Zhang

Download or read book Fundamentals of Environmental Sampling and Analysis written by Chunlong Zhang and published by John Wiley & Sons. This book was released on 2024-07-03 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the Solutions Manual to accompany Fundamentals of Environmental Sampling and Analysis, Second Edition. It provides solutions to the exercises and problems found in the main volume This book introduces a comprehensive overview on the fundamentals and applications of environmental sampling and analysis for students in environmental science and engineering as well as environmental professionals involved in sampling and analytical work. The book details fundamentals of sampling, selection of standard methods, QA/QC, sample preparation, chemical and instrumental principles, and method applications to various contaminants in environmental matrices (air, water, soil, waste, and biological samples). The book gives an integrated introduction to sampling and analysis – both are essential to quality environmental data. For example, contrary to other books that introduce a specific area of sampling and analysis, this text provides a balanced mix of field sampling and laboratory analysis, essential knowledge in chemistry/statistics/hydrology/regulations, wet chemical methods for conventional chemicals as well as various modern instrumental techniques for contaminants of emerging concerns. The new edition adds three standalone chapters regarding the basics of analytical and organic chemistry, environmental data analysis, mass spectrometry and other significant amounts of new materials such as time-integrated passive sampling, incremental sampling, green sample preparation, Raman spectroscopy, chiral separation, and non-target analysis. In addition, the second edition provides more examples, visual aids, case studies, and end-of-chapter exercise problems to enhance a better understanding of the fundamentals of environmental sampling and analysis while incorporating current literature (mostly peer-reviewed journal papers) regarding the applications and challenges in the field of environmental sampling and analysis.

Environmental Interfacial Spectroscopy

Environmental Interfacial Spectroscopy

Author: Mahamud Subir

Publisher: American Chemical Society

Published: 2022-04-14

Total Pages: 339

ISBN-13: 0841299277

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Clarifying chemical processes in the environment is tantamount to creating a better and a safer planet. The chemistry that takes place within the natural world occurs not only in the bulk gaseous, liquid, and solid phases, but also in the region where two phases meet. This molecularly thin region between phases, also known as an interface, plays a significant role in various chemical processes because interfaces are ubiquitous in nature. Despite the significance of interfacial processes in environmental chemistry, investigating environmental interfaces experimentally has always been a challenge. Recent advances in nonlinear spectroscopy (NLS) have demonstrated that techniques such as sum frequency generation (SFG) and second harmonic generation (SHG) are unique in their ability to probe buried chemical interfaces. The theoretical and practical aspect of these techniques in probing environmental interfaces is the primary focus of this e-book. This e-book is geared toward curious and inquisitive minds eager to learn how molecules behave at the thin layers of chemical interfaces. A beautiful world, rich in unique insights into the interfacial environmental processes, awaits.


Book Synopsis Environmental Interfacial Spectroscopy by : Mahamud Subir

Download or read book Environmental Interfacial Spectroscopy written by Mahamud Subir and published by American Chemical Society. This book was released on 2022-04-14 with total page 339 pages. Available in PDF, EPUB and Kindle. Book excerpt: Clarifying chemical processes in the environment is tantamount to creating a better and a safer planet. The chemistry that takes place within the natural world occurs not only in the bulk gaseous, liquid, and solid phases, but also in the region where two phases meet. This molecularly thin region between phases, also known as an interface, plays a significant role in various chemical processes because interfaces are ubiquitous in nature. Despite the significance of interfacial processes in environmental chemistry, investigating environmental interfaces experimentally has always been a challenge. Recent advances in nonlinear spectroscopy (NLS) have demonstrated that techniques such as sum frequency generation (SFG) and second harmonic generation (SHG) are unique in their ability to probe buried chemical interfaces. The theoretical and practical aspect of these techniques in probing environmental interfaces is the primary focus of this e-book. This e-book is geared toward curious and inquisitive minds eager to learn how molecules behave at the thin layers of chemical interfaces. A beautiful world, rich in unique insights into the interfacial environmental processes, awaits.