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Book Synopsis Yield of Electronic Materials and Devices by : National Research Council (U.S.). Ad Hoc Panel on Yield of Electronic Materials and Devices
Download or read book Yield of Electronic Materials and Devices written by National Research Council (U.S.). Ad Hoc Panel on Yield of Electronic Materials and Devices and published by . This book was released on 1972 with total page 104 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Book Synopsis Reliability and Failure of Electronic Materials and Devices by : Milton Ohring
Download or read book Reliability and Failure of Electronic Materials and Devices written by Milton Ohring and published by Academic Press. This book was released on 2014-10-14 with total page 759 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Book Synopsis Yield of Electronic Materials and Devices by : National Research Council (U.S.). Ad Hoc Panel on Yield of Electronic Materials and Devices
Download or read book Yield of Electronic Materials and Devices written by National Research Council (U.S.). Ad Hoc Panel on Yield of Electronic Materials and Devices and published by . This book was released on 1972 with total page 100 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Methods of Measurement for Semiconductor Materials, Process Control, and Devices by : W. Murray Bullis
Download or read book Methods of Measurement for Semiconductor Materials, Process Control, and Devices written by W. Murray Bullis and published by . This book was released on 1973 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Methods of Measurement for Semiconductor Materials, Process Control, and Devices by : United States. National Bureau of Standards
Download or read book Methods of Measurement for Semiconductor Materials, Process Control, and Devices written by United States. National Bureau of Standards and published by . This book was released on 1973 with total page 58 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Annual Report - National Academy of Engineering by : National Academy of Engineering
Download or read book Annual Report - National Academy of Engineering written by National Academy of Engineering and published by . This book was released on 1971 with total page 104 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Report of the National Academy of Sciences by : National Academy of Sciences (U.S.)
Download or read book Report of the National Academy of Sciences written by National Academy of Sciences (U.S.) and published by National Academies. This book was released on with total page 474 pages. Available in PDF, EPUB and Kindle. Book excerpt:
The third edition of this highly respected market study provides a detailed insight into the global developments of the GaAs industry to 2004, and the implications for both suppliers and users of GaAs technology. The report has been completely revised and updated with a new chapter added on competitive technologies. The report also supplies market analysis by component type and application sectors. For a PDF version of the report please call Tina Enright on +44 (0) 1865 843008 for price details.
Book Synopsis Gallium Arsenide, Electronics Materials and Devices. A Strategic Study of Markets, Technologies and Companies Worldwide 1999-2004 by : R. Szweda
Download or read book Gallium Arsenide, Electronics Materials and Devices. A Strategic Study of Markets, Technologies and Companies Worldwide 1999-2004 written by R. Szweda and published by Elsevier. This book was released on 2000-12-05 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: The third edition of this highly respected market study provides a detailed insight into the global developments of the GaAs industry to 2004, and the implications for both suppliers and users of GaAs technology. The report has been completely revised and updated with a new chapter added on competitive technologies. The report also supplies market analysis by component type and application sectors. For a PDF version of the report please call Tina Enright on +44 (0) 1865 843008 for price details.
Download or read book NBS Technical Note written by and published by . This book was released on 1973-03 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Think like an electron Organic electronic materials have many applications and potential in low-cost electronics such as electronic barcodes and in light emitting devices, due to their easily tailored properties. While the chemical aspects and characterization have been widely studied, characterization of the electrical properties has been neglected, and classic textbook modeling has been applied. This is most striking in the analysis of thin-film transistors (TFTs) using thick “bulk” transistor (MOS-FET) descriptions. At first glance the TFTs appear to behave as regular MOS-FETs. However, upon closer examination it is clear that TFTs are unique and merit their own model. Understanding and interpreting measurements of organic devices, which are often seen as black-box measurements, is critical to developing better devices and this, therefore, has to be done with care. Electrical Characterization of Organic Electronic Materials and Devices Gives new insights into the electronic properties and measurement techniques for low-mobility electronic devices Characterizes the thin-film transistor using its own model Links the phenomena seen in different device structures and different measurement techniques Presents clearly both how to perform electrical measurements of organic and low-mobility materials and how to extract important information from these measurements Provides a much-needed theoretical foundation for organic electronics
Book Synopsis Electrical Characterization of Organic Electronic Materials and Devices by : Professor Peter Stallinga
Download or read book Electrical Characterization of Organic Electronic Materials and Devices written by Professor Peter Stallinga and published by John Wiley & Sons. This book was released on 2009-10-08 with total page 316 pages. Available in PDF, EPUB and Kindle. Book excerpt: Think like an electron Organic electronic materials have many applications and potential in low-cost electronics such as electronic barcodes and in light emitting devices, due to their easily tailored properties. While the chemical aspects and characterization have been widely studied, characterization of the electrical properties has been neglected, and classic textbook modeling has been applied. This is most striking in the analysis of thin-film transistors (TFTs) using thick “bulk” transistor (MOS-FET) descriptions. At first glance the TFTs appear to behave as regular MOS-FETs. However, upon closer examination it is clear that TFTs are unique and merit their own model. Understanding and interpreting measurements of organic devices, which are often seen as black-box measurements, is critical to developing better devices and this, therefore, has to be done with care. Electrical Characterization of Organic Electronic Materials and Devices Gives new insights into the electronic properties and measurement techniques for low-mobility electronic devices Characterizes the thin-film transistor using its own model Links the phenomena seen in different device structures and different measurement techniques Presents clearly both how to perform electrical measurements of organic and low-mobility materials and how to extract important information from these measurements Provides a much-needed theoretical foundation for organic electronics
